XRD
INTRODUCTION
The Desktop X-ray Diffractometer (XRD) is licensed under Lembaga Perlesenan Tenaga Atom (LPTA). The Rigaku Miniflex X-Ray Diffractometer is a Desktop Powder Diffractometer capable of measuring powder diffraction patterns from 3 to 145 degrees in two-theta scanning range. It can be used for phase identification, qualitative and quantitative analysis and quality control of raw materials and products. The types of samples can be multi-phase microcrystals of powdered materials, metal and ceramic plates, etc. It is equipped with a 6-sample holder for maximum automation of sample measurements. The X-ray of the Cu Kα radiation filtered by a Ni filter has a wavelength of 1.54 Å. The instrument is equipped with the latest version of PDXL, Rigaku's full-function powder diffraction analysis package. The latest version of PDXL offers important new functionality; including a fundamental parameter method (FP) for more accurate peak calculation and phase identification using the Crystallography Open Database (COD).
SPECIFICATION
Brand : RIGAKU
Model : Miniflex II
Year : October 2011
TYPES OF SAMPLE
1)Powder
2)Metal plate
PERSON IN CHARGE
1. Shaharunizam bin Umar (+609 549 3338 / This email address is being protected from spambots. You need JavaScript enabled to view it.)
2. Mohd Farid Jaafar (+609 549 8094 / This email address is being protected from spambots. You need JavaScript enabled to view it.)
COST OF ANALYSIS
| Status | Rate | Remark |
| Internal | RM 60 | Per sample |
| External | RM 110 | Per sample |
| *Price not include GST 6% |
REFERENCE